Scanning Electron Microscopy and X - ray Microanalysis

di Goldstein - Newbury - Joy - Lyman - Echlin - Lifshin - Sawyer • 2003 • dettagli prodotto

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DESCRIZIONE

Providing a comprehensive introduction to the capabilities and use of scanning electron microscopes (SEM) and x-ray spectrometers, this highly acclaimed text emphasizes practical aspects of imaging and analysis for a broad audience of students and practitioners whose backgrounds span a wide range of science and technology. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition, techniques for the elimination of charging in non-conducting specimens are detailed. A database of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This third edition has been extensively revised, including new sections on: •Variable-pressure SEM,•Electron backscatter diffraction (EBSD),•Recent developments in x-ray detectors, and expanded coverage of:•Low-voltage SEM,•X-ray mapping,•Specimen preparation.