Dermatopathology - High Yield Pathology
di Brinster - Liu - Diwan - McKee • 2011 • dettagli prodotto
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188,40
DESCRIZIONE
Save time diagnosing skin diseases with High Yield Dermatopathology, edited by Drs. Nooshin Brinster, Vincent Liu, Hafeez Diwan, and Phillip McKee. Part of the High Yield Pathology Series, this title is designed to help you review the key pathologic features of skin disease, recognize the classic look of each disease, and quickly confirm your diagnosis. Its templated format, excellent color photographs, concise bulleted text, and authoritative content, will help you accurately identify more than 400 skin conditions.
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ISBN: 9781416099765
Titolo: Dermatopathology - High Yield Pathology
Autori: Brinster - Liu - Diwan - McKee
Editore: Elsevier - Saunders
Volume: Unico
Edizione: 2011
Lingua: Inglese
Finitura: Copertina flessibile
Misure: 22x28 cm
Pagine: 624
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